About Affecting Defects

The Affecting Defects view of the Model Version Hierarchy page shows all defects that affect the selected model version revision and any model version revisions further down in the model version hierarchy. This means that the error causing a defect is somewhere in one of the model versions in that model version revision's hierarchy and, therefore, it may also affect the selected model version revision. From a model version hierarchy perspective, it is useful to be able to identify the set of defects that affect a model version revision, either individually or because of their impact on another model version in the hierarchy below that model version revision. It is also useful to be able to see both the number of defects that are still open and the number of defects that have been closed with a workaround or waiver, as well as the dispositions associated with those defects for all model version revisions in the hierarchy.

This page discusses:

Roll Up Counts
Defects without Dispositions

Roll Up Counts

Disabling roll up counts in the Affecting Defects view of the Model Version Hierarchy page shows only the number of defects directly affecting each model version in the hierarchy. Enabling Roll Up Counts shows the cumulative number of defects that affect each level of the model version hierarchy.

By default, the Affecting Defects view of the Model Version Hierarchy page has Roll Up Counts disabled. Enabling Roll Up Counts allows you to see both the total number of defects for the specific model version revision and the number of affecting defects that are rolled up from each of the model version revisions lower in the model version hierarchy. For example, if Roll Up Counts is set to Yes (enabled), clicking an Unresolved Defects (without Dispositions) count of 11 (6) for CHIP might show a breakdown of 6 defects reported against ALU, 4 defects reported against CPU, and 1 defect for CHIP itself. The 4 defects for CPU might break down further into 2 for RAM (which is below CPU in the model version hierarchy) and 2 for CPU itself. A total of 6 of these defects do not have dispositions. A Waived Defects (without Dispositions) count of 4(1) reported against CHIP might break down into 0 defects for ALU, 0 defects for CPU, 2 defects for RAM, and 2 defects for CHIP itself. One of these defects does not have a disposition.

Defects without Dispositions

It is useful to be able to quickly see whether a defect affecting model versions in the hierarchy has a disposition for an affected model version revision.

Defects affecting a model version revision are included in the Unresolved Defects (without Dispositions) column if they are in the Open or Test states, if they first existed in this revision or an earlier one, and are not yet fixed (in the Closed state) in this or an earlier model version revision. The count of these defects that do not have a disposition is included in parentheses. Defects affecting a model version revision are included in the Waived Defects (without Dispositions) column if they first existed in this revision or an earlier one and have been closed with a waiver or workaround resolution in this revision or an earlier one. The count of these defects that do not have a disposition is included in parentheses. In both cases, "first existed" means that the defect was either introduced in the model version revision or reported against that revision. The model version revision that a defect was introduced in is assumed to be earlier than the one it was reported against.

Click the counts in the Unresolved Defects (without Dispositions) and Waived Defects (without Dispositions) columns to see more details about the affecting defects and their dispositions. See Affecting Open or Waived Defects Reports.

Example

An Affecting Defects view is generated for model version CHIP revision 1.3.1.6. The defect action committed to revision 1.3.1.4 is included in the Waived Defects count, since it was introduced in an earlier revision (1.2) and was closed in an earlier revision (1.3.1.4) with a waiver. This defect is not included in the Unresolved Defects count.

An Affecting Defects view is generated for model version CHIP revision 1.3. The defect is included in the Unresolved Defects count, since it was introduced in an earlier revision (1.2) and there is no defect action that was closed in an earlier revision. This defect is not included in the Waived Defects count.

The defect action committed to Trunk:Latest is fixed and a new release of the model version is made, using the Release As Revision function. This new revision is 1.8. The defect action is modified to be committed to this revision. An Affecting Defects view is generated for the new CHIP revision 1.8. This time, the defect is not included in the Unresolved Defects count since, although it was introduced in an earlier revision (1.2), there is also a defect action that has been closed against this (or an earlier) revision, and therefore the issue has been resolved in this revision. This defect is not included in the Waived Defects count because it was not closed with a workaround or waiver.